Wafers are a key component for microelectronic devices. Over the past few decades, their diameter has steadily increased, allowing manufacturers to produce more chips with the same size equipment.
Wafer fabs use precision dicing tools to separate the
individual silicon wafers into individual die, known as "dies".
Dicing can be performed on single-project wafers (MPW) or pizza wafers with
reticle.
High Yield
Wafer Dicing Services
get larger, more microchips fit on each one. But it takes a huge amount of raw
material to produce those large wafers. According to Rose Associates, the
actual silicon going into use in a 150mm wafer is only about 30 percent, and
that percentage gets lower with each enlargement of the wafer size.
KLA’s defect inspection and review systems ensure quality
throughout the wafer fabrication process. Metrology and data management systems
provide a comprehensive view of the entire manufacturing process, preventing
production defects from impacting yield.
Characterize critical aspects of novel thin films such as
stress, uniformity and thickness with advanced microscopy systems that measure
metals, hazes, organic contamination and other surface discoloration. Focused
ion beam (FIB) circuit edit services quickly cut traces or add metal
connections, eliminating the need for costly new fab lots. Our ATE test
equipment supports first silicon debug thru release to high volume production
for Digital, RF and other applications.
High Precision
In the semiconductor industry, precision is a measure of
reproducibility. If multiple trials of the same experiment show minimal
deviations, then it has high precision. An archer hitting a bulls-eye on a
target five times in a row would be an example of high precision.
The same is true for manufacturing processes. The more
exacting a process is, the higher the precision. This is especially important
for tools that use a non-standard substrate, such as silicon on glass or GaN
(gallium nitride) on SiC.
The high precision offered by Brooks’ material handling
systems ensures that your wafers are transferred from one tool to the next
precisely and accurately. For example, the end effectors (the robot handling
units that grab the wafers) are configured to match the shape and size of the particular
type of wafer being handled. This is done to avoid any damage to the delicate
surface of the substrate. These systems also allow for a buffering strategy
that minimizes first wafer delays.
Low Cost
Larger wafers allow for more microchips to be produced with
one fabrication run, increasing yield and efficiency. This increased yield has
also increased the amount of actual silicon that goes into a product from a
given silicon ingot, reducing overall costs.
With demand for electronics and portable devices constantly
growing, companies are under pressure to shrink size while maintaining quality
and lowering cost. These goals have led to the industry trend towards larger
wafer sizes, pushing target manufacturers to improve their production
capabilities.
Our team has the expertise and experience to design durable,
cost-efficient manual stations for any clean room process. We utilize
industrial-strength polypropylene to ensure these stations meet or exceed all
safety requirements, while offering the flexibility needed for a wide range of
applications. We offer specialized services for thin film characterization,
defect inspection and metrology, including particle, haze and organic
contamination analysis. We also provide ATE testing, system-level testing, reliability
and IC-level failure analysis.
Fast Turnaround
Whether it’s getting your images back into your client’s
hands or driving repeat business, a fast turnaround is a huge benefit for your
company. But that doesn’t mean it has to be done at the expense of quality.
We offer an array of equipment that’s designed to support
your semiconductor manufacturing process. From inspection and review systems to
metrology and data management, we can help you achieve faster turnarounds
without sacrificing quality. We can also provide focused ion beam (FIB) circuit
edit services to quickly cut traces or add metal connections on an individual
wafer or small area of the device.
Backgrinding & Polishing
Services with our comprehensive reliability qualification service,
we can identify the wear-out mechanisms in your devices, detect design
marginality combined with parameter drift and determine failure rates due to
latent manufacturing defects. This allows you to improve your yield over time.
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